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KMID : 0357520100330030289
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Journal of Radiological Science and Technology
2010 Volume.33 No. 3 p.289 ~ p.294
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Analysis of the Signal Properties of Polycrystalline Film Detector under Radiographic Irradiation Condition
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Kim Jong-Eon
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Abstract
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The purpose of this study is an evaluation of the performance of a detector under radiographic irradiation condition by fabricating the polycrystalline film detector. The polycrystalline film detectors with thickness of 210 and were fabricated by screen print technology. Measurements of X-ray sensitivity and dark current were performed for two detectors. And measurements of the linearity of X-ray response and reproducibility were performed for the detector of thickness . For applied electric field strengths from 0.05 to to the detector of thickness , the X-ray sensitivities were measured from 233 to . And the dark currents were measured from 3.2 to . Compared with values reported by Zhong Su et al., the X-ray sensitivities exhibit about two times larger than the X-ray sensitivities measured by Zhong Su et al. And the dark currents exhibit about nine times larger than the dark currents measured by Zhong Su et al. The linearity of X-ray response acquired 0.988 as a coefficient of correlation (r). Reproducibility acquired 0.002 as a coefficient of variation. This study provides the performance data of fabricated polycrystalline film detector available for an active matrix flat panel imager under radiographic irradiation condition.
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KEYWORD
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Polycrystalline film detector, X-ray sensitivity, Dark current, Reproducibility, Linearity
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